Far-field optical microscope with a nanometer-scale...

Optics: measuring and testing – Of light reflection

Reexamination Certificate

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C356S446000

Reexamination Certificate

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11256853

ABSTRACT:
A far-field optical microscope capable of reaching nanometer-scale resolution using the in-plane image magnification by surface plasmon polaritons is presented. The microscope utilizes a microscopy technique based on the optical properties of a metal-dielectric interface that may, in principle, provide extremely large values of the effective refractive index neffup to 102-103as seen by the surface plasmons. Thus, the theoretical diffraction limit on resolution becomes λ/2neff, and falls into the nanometer-scale range. The experimental realization of the microscope has demonstrated the optical resolution better than 50 nm for 502 nm illumination wavelength.

REFERENCES:
patent: 2005/0185186 (2005-08-01), Smolyaninov et al.

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