Optics: measuring and testing – Of light reflection
Reexamination Certificate
2008-04-22
2008-04-22
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Of light reflection
C356S446000
Reexamination Certificate
active
07362440
ABSTRACT:
A far-field optical microscope capable of reaching nanometer-scale resolution using the in-plane image magnification by surface plasmon polaritons is presented. The microscope utilizes a microscopy technique based on the optical properties of a metal-dielectric interface that may, in principle, provide extremely large values of the effective refractive index neffup to 102-103as seen by the surface plasmons. Thus, the theoretical diffraction limit on resolution becomes λ/2neff, and falls into the nanometer-scale range. The experimental realization of the microscope has demonstrated the optical resolution better than 50 nm for 502 nm illumination wavelength.
REFERENCES:
patent: 2005/0185186 (2005-08-01), Smolyaninov et al.
Davis Christopher C.
Smolyaninov Igor I.
Carter DeLuca Farrell & Schmidt LLP
The University of Maryland
Toatley , Jr. Gregory J.
Ton Tri
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