Far field light microscopical method, system and computer...

Details Far field light microscopical method, system and computer... Far field light microscopical method, system and computer...

2007-11-20

2007-11-20

Stafira, Michael P. (Department: 2886)

Optics: measuring and testing

Plural test

Reexamination Certificate

active

10492266

ABSTRACT:
The present invention relates to a far field light microscopical method, respectively a system and a computer program product for analysing at least one object having a subwavelength size in at least one spatial direction to obtain spatial information of the object, in particular size and topology thereof, comprising the steps of:—labelling the object(s) with one or more suitable optical markers;—providing suitably structured illumination light to at least partially illuminate the object(s);—subjecting the object(s) to the structured illumination light;—detecting an optical response of the object(s);—obtaining the spatial information of the object(s) by comparing the obtained response with simulation data of an optical response of object(s) having known spatial information.

REFERENCES:
patent: 6017434 (2000-01-01), Simpson et al.
patent: 6104945 (2000-08-01), Modell et al.
patent: 6259104 (2001-07-01), Baer
patent: 198 30 596 (1999-01-01), None
patent: 0 732 584 (1996-09-01), None
patent: 0 1008 845 (2000-06-01), None
Fai-field fluorescence microscopy beyond the diffraction limit—XP-001146247—A.M. van Oijen, J. Kohler, and J. Schmidt—vol. 16, No. 4, Apr. 1999—pp. 909-915.

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