Failure simulation method

Details Failure simulation method Failure simulation method

1995-05-24

1997-01-21

Beausoliel, Jr., Robert W.

Excavating

364578, 371 26, G06F 1100

Patent

active

055965865

ABSTRACT:
Specific values X.sub.1 to X.sub.n are set to signal lines both in a normal circuit having no failure and in a failure circuit having an assumed failure (in the step S11). Applying a test vector F to the circuits, a simulation of signal propagation is performed (in the step S14). Since the specific values or the inverted specific values instead of undefined values propagate on the signal lines, with respect to more types of failures than ever, it becomes possible to determine the capability of the test vector for detecting different kinds of failure.

REFERENCES:
patent: 4773028 (1988-09-01), Tallman
patent: 5189365 (1993-02-01), Ikeda et al.

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