Failure indicator for a protection component

Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means

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257528, H01L 2900, H01L 2976

Patent

active

059699221

ABSTRACT:
A failure detector associated with a four-layer semiconductor protection component has a middle layer that corresponds to a low-doped semiconductor substrate of a first conductivity type. The component includes in this substrate, in addition to plurality of regions providing its protection function, at least one additional region of the second conductivity type connected to a test terminal.

REFERENCES:
patent: 4208669 (1980-06-01), Silber et al.
patent: 4901183 (1990-02-01), Lee
patent: 4907119 (1990-03-01), Allina
patent: 5243488 (1993-09-01), Bernier
Patent Abstracts of Japan, vol. 8, No. 181 (E-261) Aug. 21, 1984 & JP-A-59072766 (Toshiba).
French Search Report from French Patent Application 94 04759, filed Apr. 14, 1994.

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