Failure analysis system, failure analysis method, and...

Image analysis – Applications – Document or print quality inspection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C382S174000, C358S001140

Reexamination Certificate

active

07903844

ABSTRACT:
A failure analysis system includes an obtaining portion that obtains read-in image information that is image information obtained by reading an output image, a memory that stores fundamental image reduction information that is information in which an information amount of fundamental image information is reduced, the fundamental image information serving as a fundamental of the output image, a calculating portion that calculates a characteristic value of a projecting waveform by use of differential information between read-in image reduction information and the fundamental image reduction information, the read-in image reduction information being information in which the information amount of the read-in image information obtained by the obtaining portion is reduced, the fundamental image reduction information being stored in the memory; and a determining portion that determines a defect type group that is a group of defect types of elements included in the output image by use of a clustering process.

REFERENCES:
patent: 5757981 (1998-05-01), Kawakubo
patent: 6665425 (2003-12-01), Sampath et al.
patent: 2003/0113000 (2003-06-01), Hyoki et al.
patent: 1 109 395 (2001-06-01), None
patent: A 3-154128 (1991-07-01), None
patent: A 5-114970 (1993-05-01), None
patent: B2 2534387 (1996-09-01), None
patent: B2 2564490 (1996-12-01), None
patent: B2 2793424 (1998-09-01), None
patent: A 11-164081 (1999-06-01), None
patent: A 2000-62299 (2000-02-01), None
patent: A-2001-245091 (2001-09-01), None
patent: A 2002-40724 (2002-02-01), None
patent: A 2004-085668 (2004-03-01), None
patent: B2 3581897 (2004-10-01), None
patent: A 2005-91766 (2005-04-01), None
patent: A 2005-107067 (2005-04-01), None
patent: A 2005-341005 (2005-12-01), None
patent: A 2006-62171 (2006-03-01), None
patent: A 2006-252002 (2006-09-01), None
patent: A 2007-74290 (2007-03-01), None
patent: A 2007-88664 (2007-04-01), None
patent: A 2007-102506 (2007-04-01), None
patent: A 2007-133472 (2007-05-01), None
patent: A 2007-280136 (2007-10-01), None
Yokosawa; “Human Character Retrieval Process and Its Application to Textual Image Retrieval;” Journal of Institute of Electronic Information Communication Engineers; Japan; Institute of Electronic Information Communication Engineers; Feb. 25, 1990; J73-D-II; 2; pp. 191-199; with partial English-language translation.
Notice of Reason(s) for Refusal issued in Japanese Patent Application No. 2006106765; mailed Aug. 3, 2010; with English-language translation.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Failure analysis system, failure analysis method, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Failure analysis system, failure analysis method, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Failure analysis system, failure analysis method, and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2667082

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.