Failsafe mechanism for preventing an integrated circuit from...

Details Failsafe mechanism for preventing an integrated circuit from... Failsafe mechanism for preventing an integrated circuit from...

2007-11-20

2007-11-20

Verbitsky, Gail (Department: 2859)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

C374S170000, C327S513000, C702S130000

Reexamination Certificate

active

11236701

ABSTRACT:
Techniques for preventing an integrated circuit (IC) from overheating are described herein. According to one embodiment, an exemplary process includes detecting whether a temperature of an integrated circuit (IC) exceeds a threshold independent of an operating state of the IC, and removing at least a portion of a power from the IC if the temperature of the IC exceeds the threshold. Other methods and apparatuses are also described.

REFERENCES:
patent: 4980586 (1990-12-01), Sullivan et al.
patent: 5287292 (1994-02-01), Kenny et al.
patent: 5303390 (1994-04-01), Little
patent: 5355123 (1994-10-01), Nishiura et al.
patent: 5451892 (1995-09-01), Bailey
patent: 5590061 (1996-12-01), Hollowell et al.
patent: 5623594 (1997-04-01), Swamy
patent: 5686858 (1997-11-01), Malherbe
patent: 5713030 (1998-01-01), Evoy
patent: 5731735 (1998-03-01), Yokota et al.
patent: 5805403 (1998-09-01), Chemla
patent: 5835553 (1998-11-01), Suzuki
patent: 5838578 (1998-11-01), Pippin
patent: 5886564 (1999-03-01), Sato et al.
patent: 6005408 (1999-12-01), Gillette
patent: 6006168 (1999-12-01), Schumann et al.
patent: 6094085 (2000-07-01), Okayasu et al.
patent: 6157231 (2000-12-01), Wasson
patent: 6169442 (2001-01-01), Meehan et al.
patent: 6321175 (2001-11-01), Nagaraj
patent: 6363490 (2002-03-01), Senyk
patent: 6373768 (2002-04-01), Woo et al.
patent: 6393374 (2002-05-01), Rankin et al.
patent: 6396321 (2002-05-01), Watanabe et al.
patent: 6400741 (2002-06-01), Matsunaga et al.
patent: 6590439 (2003-07-01), Larson
patent: 6630754 (2003-10-01), Pippin
patent: 6631503 (2003-10-01), Hsu et al.
patent: 6637934 (2003-10-01), Henderson et al.
patent: 6694282 (2004-02-01), Perner
patent: 6789037 (2004-09-01), Gunther et al.
patent: 6809568 (2004-10-01), Kamel et al.
patent: 6864802 (2005-03-01), Smith et al.
patent: 6904379 (2005-06-01), Hanzawa et al.
patent: 6934652 (2005-08-01), Gauthier et al.
patent: 2002/0075163 (2002-06-01), Smith et al.
patent: 2003/0038648 (2003-02-01), Gold et al.
patent: 2003/0042885 (2003-03-01), Zhou et al.
patent: 2003/0158697 (2003-08-01), Gold et al.
patent: 2004/0037346 (2004-02-01), Rusu et al.
patent: 2004/0070910 (2004-04-01), Gergintschew
patent: 2004/0103330 (2004-05-01), Bonnett
patent: 2004/0164781 (2004-08-01), Doyle
patent: 2004/0196090 (2004-10-01), Sutherland
patent: 2005/0228612 (2005-10-01), Oh

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