Failsafe mechanism for preventing an integrated circuit from...

Details Failsafe mechanism for preventing an integrated circuit from... Failsafe mechanism for preventing an integrated circuit from...

2005-12-13

2005-12-13

Verbitsky, Gail (Department: 2859)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

C327S513000, C702S130000

Reexamination Certificate

active

06974252

ABSTRACT:
Techniques for preventing an integrated circuit (IC) from overheating are described herein. According to one embodiment, an exemplary process includes detecting whether a temperature of an integrated circuit (IC) exceeds a threshold independent of an operating state of the IC, and removing at least a portion of a power from the IC if the temperature of the IC exceeds the threshold. Other methods and apparatuses are also described.

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