Fail-safe scan circuit and a multibeam sensor

Details Fail-safe scan circuit and a multibeam sensor Fail-safe scan circuit and a multibeam sensor

1993-07-14

1996-02-27

Peng, John K.

Communications: electrical

Condition responsive indicating system

With particular system function

340518, 364138, 364140, G08B 2900

Patent

active

054952280

ABSTRACT:
A fail-safe scan circuit sequentially and periodically drives and scans objective devices. The scan circuit has a failure detector that provides, upon detecting a failure, a signal of logical value 0 to inform of the failure. Adjacent input signals to the failure detector have a phase difference of .pi.. This phase difference results in simplifying the structure of the failure detector. The fail-safe scan circuit is employable to drive and scan many photosensors of a fail-safe multibeam sensor.

REFERENCES:
patent: 3970846 (1976-07-01), Schofield et al.
patent: 4309696 (1982-01-01), Nagai et al.
patent: 4414539 (1983-11-01), Armer
patent: 4528553 (1985-07-01), Hastings et al.
patent: 4607252 (1986-08-01), Neri
patent: 4661880 (1987-04-01), Futsuhara
patent: 4667184 (1987-05-01), Futsuhara
patent: 4682153 (1987-07-01), Boozer et al.
patent: 4757417 (1988-07-01), Futsuhara

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