Fail judging method for analysis and analyzer

Details Fail judging method for analysis and analyzer Fail judging method for analysis and analyzer

2006-08-01

2006-08-01

Noguerola, Alex (Department: 1753)

Electrolysis: processes, compositions used therein, and methods

Electrolytic analysis or testing

C205S777500, C204S403010, C204S401000

Reexamination Certificate

active

07083712

ABSTRACT:
An analyzer (A) includes a measurer (42) for measuring an electro-physical quantity of a sample, and an acceleration measurer (43) for computing the acceleration of change of the electro-physical quantity such as a current measured by the measurer (42). The fail determination as to whether or not a predetermined condition necessary for performing analysis of the sample is satisfied is made based on the acceleration computed by the acceleration measurer (43). As a result, the fail determination in the analysis process of the sample can be performed accurately.

REFERENCES:
patent: 3786352 (1974-01-01), Woods et al.
patent: 4626413 (1986-12-01), Blades et al.
patent: 4931402 (1990-06-01), Abplanalp
patent: 5352351 (1994-10-01), White et al.
patent: 2001/0042683 (2001-11-01), Musho et al.
patent: 0922954 (1999-06-01), None
patent: 60-159642 (1985-08-01), None
patent: 64-23150 (1989-01-01), None
patent: 4-357452 (1992-12-01), None
patent: 4-361157 (1992-12-01), None
patent: 6-109688 (1994-04-01), None
patent: 8-502589 (1996-03-01), None
patent: 9-264875 (1997-10-01), None
patent: 2001-66274 (2001-03-01), None
patent: 2001-66279 (2001-03-01), None
English language translation of JP 4-361157 A (patent published on Dec. 14, 1992).
English language translation of JP 9-264875 (patent published on Oct. 7, 1997).

Affiliated with

Also associated with

Rating

Fail judging method for analysis and analyzer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fail judging method for analysis and analyzer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fail judging method for analysis and analyzer will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3647933