Fail address analysis and repair system for semiconductor test

Details Fail address analysis and repair system for semiconductor test Fail address analysis and repair system for semiconductor test

1996-11-22

1998-11-24

Nguyen, Hoa T.

Excavating

371 211, G06F 1100

Patent

active

058417834

ABSTRACT:
It is an object of the present invention to provide a repair address analysis system for a semiconductor test which can effect repair of a memory device from fails in a short time even when a fail is produced on a repair line. Fail count means effects counting of fail bits for an address value of a memory device and counting of fail bits of an address value of a repair line simultaneously with each other, and information of the repair line is replaced into the counted address.

REFERENCES:
patent: 4460999 (1984-07-01), Schmidt
patent: 5107464 (1992-04-01), Sahara et al.
patent: 5410687 (1995-04-01), Fujisaki et al.

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