Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2007-12-18
2007-12-18
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C702S183000
Reexamination Certificate
active
11653244
ABSTRACT:
A factor estimating device estimates a factor from a defective result generated in a target system for diagnosis. A factor estimating process is carried out based on causality network recorded in an estimate knowledge recording part, and data on input items corresponding to conditions included in the causality network are obtained. Based on the obtained data, fitness factors are calculated, and certainty factor is obtained for each factor as representing the group of fitness factors corresponding to conditions included in the factor estimating paths. Influence factors showing the degree of influence of obtained data on input items are calculated, and data on input items with high influence factor are obtained.
REFERENCES:
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patent: 2006/0287843 (2006-12-01), Matsushita et al.
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Japan patent application publication No. 2001-523026, machine translation into English, Nov. 20, 2001.
Japan patent application publication No. 2001-519559, machine translation Into English, Oct. 23, 2001.
Beyer & Weaver, LLP
Nghiem Michael
OMRON Corporation
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