Facial feature evaluation based on eye location

Image analysis – Applications – Personnel identification

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C382S115000, C382S118000, C382S154000

Reexamination Certificate

active

07809171

ABSTRACT:
One embodiment of the present invention includes interrogating a location along a face of a person with multiple wavelengths of electromagnetic radiation. Signals are established corresponding to detection of the wavelengths reflected from the location. A determination is made as to whether a disguising material covers at least a part of the face based on a difference in range to the location indicated by these signals. Alternatively, the signals may correspond to reflections by different portions of an eye of the person and a determination is made regarding the location of one or more eyes of the person based on the signals. In one particular nonlimiting form, a multispectral, three-dimensional signature of facial features is registered to eye location that may include the iris, nose, chin, mouth, check or the like for facial recognition/identification.

REFERENCES:
patent: 4307939 (1981-12-01), Berg
patent: 4777630 (1988-10-01), Burns
patent: 4975969 (1990-12-01), Tal
patent: 5060304 (1991-10-01), Solinsky
patent: 5142400 (1992-08-01), Solinsky
patent: 5561718 (1996-10-01), Trew et al.
patent: 5572596 (1996-11-01), Wildes
patent: 5644642 (1997-07-01), Kirschbaum
patent: 5745437 (1998-04-01), Wachter et al.
patent: 5956122 (1999-09-01), Doster
patent: 5991429 (1999-11-01), Coffin et al.
patent: 5995639 (1999-11-01), Kado et al.
patent: 6027216 (2000-02-01), Guyton et al.
patent: 6053613 (2000-04-01), Wei et al.
patent: 6064752 (2000-05-01), Rozmus et al.
patent: 6069967 (2000-05-01), Rozmus et al.
patent: 6128398 (2000-10-01), Kuperstein et al.
patent: 6134339 (2000-10-01), Luo
patent: 6137896 (2000-10-01), Chang et al.
patent: 6252977 (2001-06-01), Salganicoff et al.
patent: 6497483 (2002-12-01), Frey et al.
patent: 6507309 (2003-01-01), McMakin et al.
patent: 6529617 (2003-03-01), Prokoski
patent: 6540392 (2003-04-01), Braithwaite
patent: 6603491 (2003-08-01), Lemelson et al.
patent: 6665426 (2003-12-01), Kim
patent: 6698653 (2004-03-01), Diamond et al.
patent: 6714665 (2004-03-01), Hanna et al.
patent: 7280678 (2007-10-01), Haven et al.
patent: 7336987 (2008-02-01), Laurence et al.
patent: 2002/0044674 (2002-04-01), Pavlidis
patent: 2002/0106112 (2002-08-01), Chen et al.
patent: 2002/0111607 (2002-08-01), Bille
patent: 2002/0114495 (2002-08-01), Chen et al.
patent: 2002/0136435 (2002-09-01), Prokoski
patent: 2002/0136448 (2002-09-01), Bortolussi et al.
patent: 2003/0053663 (2003-03-01), Chen et al.
patent: 2003/0161505 (2003-08-01), Schrank
patent: 2003/0223037 (2003-12-01), Chernyak
patent: 2003/0235335 (2003-12-01), Yukhin et al.
patent: 2004/0037450 (2004-02-01), Bradski
patent: 2004/0076313 (2004-04-01), Bronstein et al.
patent: 2004/0190759 (2004-09-01), Caldwell
Hitzenberger, Christoph K.. “Optical Measurement of the Axial Eye Length by Laser Doppler Interferometry.” Investigative Ophtalmology & Visual Science 32-3(1991):616-624.
Chang, Yu-Wen, and Michael Johnson. “Portable Concealed Weapon Detection Using Millimeter Wave FMCW Radar Imaging.” National Institute of Justice Office of Science and Technology (2001).
Sekine, Akihiko, Isao Minegishi, and Hiroshi Koizumi. “Axial eye-length measurement by wavelength-shift interferometry.” J. Opt. Soc. Am. A 10-7(1993).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Facial feature evaluation based on eye location does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Facial feature evaluation based on eye location, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Facial feature evaluation based on eye location will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4194000

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.