Image analysis – Pattern recognition – Classification
Reexamination Certificate
2006-12-05
2006-12-05
Chawan, Sheela (Department: 2624)
Image analysis
Pattern recognition
Classification
C382S159000, C382S253000, C382S276000, C706S020000
Reexamination Certificate
active
07146050
ABSTRACT:
A procedure for fast training and evaluation image classification systems using support vector machines (SVMs) with linear input features of high dimensionality is presented. The linear input features are derived from raw image data by means of a set of m linear functions defined on the k-dimensional raw input data, and are used for image classification, including facial recognition tasks.
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Lienhart Rainer W.
Maydt Jochen
Chawan Sheela
Gadkari Sanjay S.
Intel Corporation
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