Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate
2011-03-22
2011-03-22
Lee, Hwa S. A (Department: 2886)
Optics: measuring and testing
By light interference
Using fiber or waveguide interferometer
C356S519000, C356S454000
Reexamination Certificate
active
07911623
ABSTRACT:
Disclosed is a microelectromechanically tunable Fabry-Perot device and method of manufacturing tunable Fabry-Perot device and method of manufacturing. The F-P device comprises a first and second substrate which has partially reflective planar surfaces, and the partially reflective planar surfaces are separated by a predetermined separation distance and aligned to provide a F-P cavity, where one or more piezoelectric members are adapted to displace the first and second substrates when an electric field is applied.
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Gulvin Peter M.
Lin Pinyen
Mestha Lalit Keshav
Wang Yao Rong
A Lee Hwa S.
Fay Sharpe LLP
Xerox Corporation
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