Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1999-04-05
2000-09-05
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356352, G01B 902
Patent
active
06115122&
ABSTRACT:
A multi-wavelength reference for use in identifying and measuring wavelengths of radiation from an optical device. The invention provides an interferometer to generate a comb of accurately spaced peaks spanning a selected wavelength range combined with a fiber Bragg grating (FBG) of known Bragg wavelength to generate a peak or notch of known wavelength for use in identifying or marking a peak of the comb. The combination provides an accurate multi-wavelength reference useful in particular with high resolution wavelength scanners, such as tunable FFPI. The invention further provides systems for controlling, and/or compensating for, relative shifts in the wavelengths of the interferometer and the FBG as a function of changing temperature.
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Bao Yufei
Daugherty David
Hsu Kevin
Li Tom Q. Y.
Miller Calvin M.
Micron Optics Inc.
Turner Samuel A.
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