Fabrication of self-aligned reflective/protective overlays...

Details Fabrication of self-aligned reflective/protective overlays... Fabrication of self-aligned reflective/protective overlays...

2007-04-03

2007-04-03

Fletcher, III, William Phillip (Department: 1762)

Coating processes

Magnetic base or coating

Magnetic coating

C427S131000

Reexamination Certificate

active

11146656

ABSTRACT:
A magnetoresistance sensor is fabricated using a sensor structure including a free layer deposited upon a lower layered structure and depositing an oxide structure overlying the free layer. The depositing of the oxide structure includes the steps of depositing a buffer layer overlying the free layer, wherein the buffer layer is a buffer-layer metal when deposited, depositing an overlayer overlying and contacting the buffer layer, the overlayer being an overlayer metallic oxide of an overlayer metal, and oxidizing the buffer layer to form a buffer layer metallic oxide.

REFERENCES:
patent: 6759120 (2004-07-01), Jongill et al.
patent: 2001230471 (2001-08-01), None
patent: 20020057762 (2002-07-01), None

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