Fabrication of dielectrically isolated devices utilizing buried

Metal treatment – Compositions – Heat treating

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29571, 29576B, 148175, 148187, 148DIG82, 148DIG83, H01L 21265, H01L 2120

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046768416

ABSTRACT:
Dielectrically isolated devices are produced by a series of steps including the implantation of a silicon substrate to produce a precursor to the silicon oxide region and subsequently heat treating this region. In contrast to previous techniques, the extent of such heating is substantially increased to remove a non-oxidic intermediary region typically remaining.

REFERENCES:
patent: 4317686 (1982-03-01), Anand et al.
patent: 4412868 (1983-11-01), Brown et al.
patent: 4461670 (1984-07-01), Celler et al.
patent: 4490182 (1984-12-01), Scovell
Hemment et al., Vacuum, vol. 34 (Jan. 1984) 203.
Maeyama et al., Jap. Jour. Appl. Physics, 21 (1982) 744.
Jager et al., Thin Solid Films, 123 (1985) 159.
Hemment et al., Thin Solid Films, 128 (Jun. 1985) 125.
Hemment et al., in Ion Implantation & Ion Beam Processing of Materials, ed. Hubler et al., 1983, North-Holland, N.Y. p. 281.
Lam in Energy Beam--Thermal Processing, ed. Fan et al., North-Holland, 1983, N.Y., p. 579.
Pinizzotto in Ion Impl . . . -of Materials, ed. Hubler et al., North-Holland, N.Y. 1983, p. 265.
Gill et al., Ibid, 1983, p. 275.
Feldman et al., Phys. Rev. Letts. 41, 1978, 1396.

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