Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2005-09-06
2005-09-06
Letscher, Geraldine (Department: 1752)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
C430S311000
Reexamination Certificate
active
06939649
ABSTRACT:
A method of fabrication of a semiconductor integrated circuit device uses a mark having, on a first main surface of a mask substrate, a first light transmitting region, a second light transmitting region disposed at the periphery of the first light transmitting region and permitting inversion of the phase of light transmitted through the second light transmitting region relative to light transmitted through the first light transmitting region, and a light shielding region disposed at the periphery of the second light transmitting region. The second light transmitting region is formed from a first film deposited over the first main surface of the mask substrate, said light shielding region is formed by a second film deposited over the first main surface of the mask substrate via said first film, and at least one of said first film and second is formed from a resist film.
REFERENCES:
patent: 4684971 (1987-08-01), Payne
patent: 5376483 (1994-12-01), Rolfson
patent: 5378585 (1995-01-01), Watanabe
patent: 5389474 (1995-02-01), Iguchi et al.
patent: 5418092 (1995-05-01), Okamoto
patent: 5556724 (1996-09-01), Tarumoto et al.
patent: 5741613 (1998-04-01), Moon et al.
patent: 5948572 (1999-09-01), Liu et al.
patent: 5989760 (1999-11-01), Mangat et al.
patent: 6576377 (2003-06-01), Kikuchi
patent: 5630129 (1981-03-01), None
patent: 5922050 (1984-02-01), None
patent: 5-289307 (1993-11-01), None
patent: 10-326009 (1998-12-01), None
patent: 11-65083 (1999-03-01), None
patent: 11-125894 (1999-05-01), None
Hasegawa Norio
Hotta Shoji
Tanaka Toshihiko
Antonelli Terry Stout & Kraus LLP
Letscher Geraldine
Renesas Technology Corp.
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