Fabrication method of polycrystalline silicon TFT

Semiconductor device manufacturing: process – Chemical etching – Altering etchability of substrate region by compositional or...

Reexamination Certificate

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C438S308000, C438S378000, C438S692000, C438S700000, C438S734000, C438S750000, C438S795000

Reexamination Certificate

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10663805

ABSTRACT:
A method of fabricating polycrystalline silicon thin film transistor according to the present invention includes: depositing a buffer layer on a substrate; depositing an amorphous silicon layer on the buffer layer with a predetermined thickness; crystallizing the deposited amorphous silicon layer by using a laser to form a polycrystalline silicon layer; etching the crystallized polycrystalline silicon layer to a predetermined thickness; curing the etched polycrystalline silicon layer; and patterning the cured polycrystalline silicon layer to form a semiconductor layer.

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patent: 2004/0266078 (2004-12-01), Kim
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patent: 10-200120 (1998-07-01), None
patent: 2000-040828 (2000-02-01), None
patent: 2002-006338 (2002-01-01), None

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