Semiconductor device manufacturing: process – Chemical etching – Altering etchability of substrate region by compositional or...
Reexamination Certificate
2007-08-21
2007-08-21
Goudreau, George A. (Department: 1763)
Semiconductor device manufacturing: process
Chemical etching
Altering etchability of substrate region by compositional or...
C438S308000, C438S378000, C438S692000, C438S700000, C438S734000, C438S750000, C438S795000
Reexamination Certificate
active
10663805
ABSTRACT:
A method of fabricating polycrystalline silicon thin film transistor according to the present invention includes: depositing a buffer layer on a substrate; depositing an amorphous silicon layer on the buffer layer with a predetermined thickness; crystallizing the deposited amorphous silicon layer by using a laser to form a polycrystalline silicon layer; etching the crystallized polycrystalline silicon layer to a predetermined thickness; curing the etched polycrystalline silicon layer; and patterning the cured polycrystalline silicon layer to form a semiconductor layer.
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Goudreau George A.
LG.Philips LCD Co. , Ltd.
McKenna Long & Aldridge LLP
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