Fabrication method of nitride-based semiconductors and...

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S094000, C257S200000, C257S103000, C257S096000, C257S097000, C257S099000, C257S089000, C438S046000, C438S047000

Reexamination Certificate

active

06844569

ABSTRACT:
The present invention relates to a fabrication method of nitride-based semiconductors and a nitride-based semiconductor fabricated thereby. In the fabrication method of the invention, a self-organizing metal layer is formed on a sapphire substrate. The sapphire substrate having the self-organizing metal layer is heated so that self-organizing metal coalesces into nanoscale clusters to irregularly expose an upper surface of the sapphire substrate. Exposed portions of the sapphire substrate is plasma etched using the self-organized metal clusters as a mask to form a nanoscale uneven structure on the sapphire substrate. A resultant structure is wet etched to remove the self-organized metal clusters. The nanoscale uneven structure formed on the sapphire substrate decreases the stress and resultant dislocation between the sapphire substrate and a nitride-based semiconductor layer as well as increases the quantum efficiency between the same.

REFERENCES:
patent: 3941647 (1976-03-01), Druminski
patent: 5952681 (1999-09-01), Chen
patent: 20030057444 (2003-03-01), Niki et al.
patent: 20030189215 (2003-10-01), Lee et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fabrication method of nitride-based semiconductors and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fabrication method of nitride-based semiconductors and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fabrication method of nitride-based semiconductors and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3400879

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.