Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of...
Reexamination Certificate
2005-02-15
2005-02-15
Nadav, Ori (Department: 2811)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
C438S322000, C257S355000
Reexamination Certificate
active
06855611
ABSTRACT:
A fabrication method of an electrostatic discharge protection circuit is described, in which a buried layer is formed in the substrate of the electrostatic discharge protection circuit, and a sinker layer electrically connected to the buried layer and a drain is also formed therein. Thereby, when the electrostatic discharge protection circuit is activated, the current flows from a source through the buried layer and the sinker layer to the drain. The current flow path is remote from the gate dielectric layer to avoid damaging the gate dielectric by a large current, so as to improve the dielectric strength of the electrostatic discharge protection circuit.
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Chen Shiao-Shien
Hsu Tsun-Lai
Tang Tien-Hao
Tseng Hua-Chou
Nadav Ori
United Microelectronics Corp.
Wu Charles C. H.
Wu & Cheung, LLP
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