Fabrication method of a semiconductor laser device

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal

Reexamination Certificate

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C438S424000, C438S425000, C438S426000, C438S427000

Reexamination Certificate

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06933159

ABSTRACT:
In a method for fabricating a semiconductor laser device, a plurality of grooves are formed in a surface of one conductive type of an InP layer. The InP layer is thermally treated in an atmosphere including at least a gas containing phosphorus and a gas containing arsenic in a mixed state, thereby forming a plurality of active regions made of InAsP in the plurality of grooves. An other conductive type of semiconductor layer is formed after the active regions are formed.

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European Search Report dated Oct. 10, 2001, application no. EP00104472.
M. Asada et al., “Gain and the Threshold of Three-Dimensional Quantum-Box Lasers”, IEEE Journal of Quantum Electronics, vol. OE-22, No. 9, pp. 1915-1921, Sep. 1986.
S. Aral et al. “GaInAsP/InP Long-Wavelength Quantum-Wire Semiconductor Lasers”, Proceedings of the 1997 Electronics Society Conference of Institute of Electronics, Information and Communication Engineers, pp. 266-267, Aug. 13, 1997 (partial translation).

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