Fabrication method for a floating-gate field-effect transistor s

Fishing – trapping – and vermin destroying

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437195, H01L 21265

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active

052665097

ABSTRACT:
A stacked floating-gate field-effect transistor ("FET") structure suitable for memory cells in a nonvolatile memory is fabricated according to a process in which a floating-gate layer is formed on a semiconductor substrate (30), oxide (42) is formed along the sidewalls (35) of the floating gate (18) extending in the channel-length direction, and an oxide-nitride-oxide ("ONO") composite layer (44) is formed along the top of the structure, including the floating gate and the sidewall oxide. The ONO composite layer and the sidewall oxide act as an isolation dielectric between the floating gate and a control gate (20) formed on top of the ONO layer.

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