Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Patent
1998-07-22
1999-11-23
Utech, Benjamin
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
514700, H01J 130
Patent
active
059899760
ABSTRACT:
A fabrication method for a sharp tip emitter first includes a trench formed on a semiconductor substrate. Next, an isolating layer is deposited over the substrate by high-density plasma chemical vapor deposition (HDP CVD). A V-shaped groove is naturally formed on the isolating layer around the trench. Next, a silicon layer is formed over the isolating layer and an ion implantation is performed into the silicon layer over the V-shaped groove. Next, a semiconductor layer is formed over the substrate. Next, a high temperature thermal process is performed to drive the implanted ions into the semiconductor layer. Next, the isolating layer is removed so that the silicon layer is separated from the substrate. Then, the tip emitter is formed.
REFERENCES:
patent: 5160492 (1992-11-01), Wang et al.
patent: 5783905 (1998-07-01), Greschner et al.
Umez-Eronini Lynette T.
United Silicon Incorporated
Utech Benjamin
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