Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed
Reexamination Certificate
2007-03-13
2007-03-13
Estrada, Michelle (Department: 2823)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
Optical characteristic sensed
C438S016000, C257SE31127, C257SE21530, C385S014000
Reexamination Certificate
active
11115723
ABSTRACT:
Provided is a fabrication alignment technique for a light guide screen. A plurality of light guide layers are provided. Each light guide layer includes a plurality of aligned light guides, each light guide having an input end, a midsection and an output end. The light guide layers are physically stacked. The input ends and the output ends are aligned. Vertical misalignment is detected with an optical detection device. In response to the detection of vertical misalignment, at least one light guide layer is horizontally adjusted.
REFERENCES:
patent: 4116739 (1978-09-01), Glenn
patent: 4929048 (1990-05-01), Cuypers
patent: 5911024 (1999-06-01), Wallace
patent: 6216351 (2001-04-01), Flubacher et al.
patent: 6297888 (2001-10-01), Noyes et al.
patent: 6316281 (2001-11-01), Lee et al.
patent: 6545261 (2003-04-01), Blake et al.
patent: 6571043 (2003-05-01), Lowry et al.
patent: 6778740 (2004-08-01), Medberry et al.
patent: 6788855 (2004-09-01), Massey et al.
patent: 6847766 (2005-01-01), Kim et al.
patent: 2003/0161573 (2003-08-01), Ishida et al.
patent: 2004/0051872 (2004-03-01), Blidegn
patent: 2004/0240803 (2004-12-01), Rechberger et al.
patent: 2005/0141822 (2005-06-01), Nagai
LandOfFree
Fabrication alignment technique for light guide screen does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Fabrication alignment technique for light guide screen, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fabrication alignment technique for light guide screen will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3743247