Fabric inspecting method and appartus for detecting flaws

Details Fabric inspecting method and appartus for detecting flaws Fabric inspecting method and appartus for detecting flaws

1988-04-01

1989-08-01

Britton, Howard W.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

26 70, 358101, H04N 718

Patent

active

048537764

ABSTRACT:
An inspection method and apparatus for searching a fabric in strip form to find lump type and void type flaws on both faces of the fabric. Strobes and image pickup elements are arranged at opposite sides of the fabric in transportation. The strobes at one side of the fabric are caused to emit light, and the image pickup elements at the same side detect light reflected by the fabric while the image pickup elements at the other side detect light passing through the fabric.

REFERENCES:
patent: 2935559 (1960-05-01), Dornier
patent: 2984699 (1961-05-01), Dornier
patent: 3419677 (1968-12-01), Fiori
patent: 3715476 (1973-02-01), Watanabe
patent: 4583181 (1986-04-01), Gerber
patent: 4748334 (1988-05-01), Kobayashi

Affiliated with

Also associated with

Rating

Fabric inspecting method and appartus for detecting flaws does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fabric inspecting method and appartus for detecting flaws, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fabric inspecting method and appartus for detecting flaws will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-135628