Eye pattern margin measurement and receiver stress detection dev

Details Eye pattern margin measurement and receiver stress detection dev Eye pattern margin measurement and receiver stress detection dev

1992-12-21

1996-02-13

Chin, Stephen

Pulse or digital communications

Testing

375226, 375227, 375228, 375349, 324 7615, 324 7616, 364487, 371 51, 4552263, 4552264, H04B 346

Patent

active

054917220

ABSTRACT:
A system and method are provided wherein binary communications signals are received, and sequences of values of like types of these, such as positive ones, positive zeroes, negative ones, and negative zeroes, are observed. Responsive to a sequence of like-type signals, a reference potential is driven generally in the direction of value of these signals, and most responsively in the direction of the greatest signal degradation. A reference potential for each type is then stored, and the one of these having the most degraded amplitude is selected, and an indication of the percentile of its degradation is provided.

REFERENCES:
patent: 3721959 (1973-03-01), George
patent: 4326168 (1982-04-01), Acker
patent: 4449223 (1984-05-01), Liskov et al.
patent: 4475210 (1984-10-01), Couch
patent: 4633465 (1986-12-01), Fitch et al.
patent: 4697265 (1987-09-01), Nozue
patent: 5019995 (1991-05-01), Saito et al.
patent: 5220581 (1993-05-01), Ferraiolo et al.
patent: 5333147 (1994-07-01), Nohara et al.
Nishimoto H., "New Method analyzing eye patterns and its applications to high-speed optical transmission system", May 1988, Journal of Lightwave Technology, vol. 6, Iss. 5, pp. 678-685.

Affiliated with

Also associated with

Rating

Eye pattern margin measurement and receiver stress detection dev does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Eye pattern margin measurement and receiver stress detection dev, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Eye pattern margin measurement and receiver stress detection dev will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-245317