Eye fundus examining apparatus

Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type

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A61B 300

Patent

active

058943374

ABSTRACT:
A eye fundus examining apparatus includes a first optical system for projecting measurement light onto the fundus of an eye, a deflecting member provided in the first optical system for deflecting the measurement light, a light receiving element for receiving the reflected light of the measurement light from the fundus of the eye, a predetermined parameter of a target on the fundus of the eye being measured from the light reception information of the light receiving element, a second optical system for projecting a tracking light beam to an area including the target on the fundus of the eye, an image pickup element for receiving the image of the target illuminated by the tracking light beam, and a control system for driving the deflecting member and directing the measurement light onto the target so that the distance of deviation from the illuminated point by the measurement light under an ideal condition on the fundus of the eye to the target image received on the image pickup element may become a set value, the set value being suitably resettable.

REFERENCES:
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patent: 4866243 (1989-09-01), Sakane et al.
patent: 5270749 (1993-12-01), Okumura
patent: 5446509 (1995-08-01), Okinishi
patent: 5455644 (1995-10-01), Yazawa et al.
patent: 5615683 (1997-04-01), Toge et al.
patent: 5757463 (1998-05-01), Kohayakawa
patent: 5787890 (1998-08-01), Reiter et al.

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