Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reexamination Certificate
2007-07-31
2007-07-31
Lester, Evelyn A. (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
C351S211000, C351S239000, C351S243000, C351S247000
Reexamination Certificate
active
10498229
ABSTRACT:
An eye characteristic measuring apparatus can effectively and properly measure and display wavefront aberration of an eye regardless of the eye state. A first illumination optical system (200A) illuminates a small area on a retina of the eye by a first light flux from a first light source unit (100). A first reception light optical system (300A) leads a part of light flux reflected from the retina (61) to a first light reception unit (510) via a first conversion member (400) for converting the reflected light flux into at least 17 beams. A measurement data judgment unit, for example, judges whether the measurement data is appropriate for calculating the wavefront aberration according to a first signal from the first light reception unit (510). For example, when the measurement data judgment unit judges that the measurement data is not appropriate, a first correction unit causes to display a check correction screen which will be detailed later and corrects the data into appropriate measurement data. Furthermore, according to the measurement data judged to be appropriate or the measurement data which has been corrected by the first correction unit (603), a calculation unit calculates the wavefront aberration of the eye (60) as optical characteristic. Moreover, a measurement result judgement unit for example, judges whether the wavefront aberration calculated by the calculation unit is appropriate. Moreover, for example, when the measurement result judgment unit judges that the measurement result is not appropriate, a second correction unit (607) causes to display the check correction screen and correct the data into appropriate measurement data.
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Hirohara Yoko
Moriyama Takuya
Foley & Lardner LLP
Kabushiki Kaisha Topcon
Lester Evelyn A.
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