Extraction of imperfection features through spectral analysis

Details Extraction of imperfection features through spectral analysis Extraction of imperfection features through spectral analysis

2008-07-22

2008-07-22

Wachsman, Hal D (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C702S035000, C702S190000, C073S602000, C073S618000

Reexamination Certificate

active

11743550

ABSTRACT:
Autonomous non-destructive inspection equipment provides automatic and/or continuous inspection and evaluation of a material under inspection. The inspection equipment preferably comprises at least one detection sensor and at least one detection sensor interface for a computer. The autonomous non-destructive inspection system may also be retrofitted into conventional inspection systems by extracting pertinent features through spectral frequency analysis and sensor compensation and utilizing those features in the autonomous non-destructive inspection system.

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