Extraction of imperfection features through spectral analysis

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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C702S035000, C702S190000, C073S602000, C073S618000

Reexamination Certificate

active

11743550

ABSTRACT:
Autonomous non-destructive inspection equipment provides automatic and/or continuous inspection and evaluation of a material under inspection. The inspection equipment preferably comprises at least one detection sensor and at least one detection sensor interface for a computer. The autonomous non-destructive inspection system may also be retrofitted into conventional inspection systems by extracting pertinent features through spectral frequency analysis and sensor compensation and utilizing those features in the autonomous non-destructive inspection system.

REFERENCES:
patent: 1823810 (1931-09-01), Wall
patent: 2527000 (1950-10-01), Drake
patent: 2582437 (1952-01-01), Jezewski et al.
patent: 2685672 (1954-08-01), Price et al.
patent: 2770773 (1956-11-01), Cooley
patent: 2881386 (1959-04-01), Price et al.
patent: 3202914 (1965-08-01), Deem et al.
patent: 4523468 (1985-06-01), Derkacs et al.
patent: 4629985 (1986-12-01), Papadimitriou et al.
patent: 4710712 (1987-12-01), Bradfield et al.
patent: 4821575 (1989-04-01), Fujikake et al.
patent: 4825385 (1989-04-01), Dolph et al.
patent: 5210704 (1993-05-01), Husseiny
patent: 5321362 (1994-06-01), Fischer et al.
patent: 5371462 (1994-12-01), Hedengren et al.
patent: 5430376 (1995-07-01), Viertl
patent: 5440237 (1995-08-01), Brown et al.
patent: 5648613 (1997-07-01), Kiefer
patent: 5671155 (1997-09-01), Edens et al.
patent: 5774378 (1998-06-01), Yang
patent: 5777891 (1998-07-01), Pagano et al.
patent: 5786768 (1998-07-01), Chan et al.
patent: 5914596 (1999-06-01), Weinbaum
patent: 5943632 (1999-08-01), Edens et al.
patent: 6115674 (2000-09-01), Brudnoy et al.
patent: 6279125 (2001-08-01), Klein
patent: 6359434 (2002-03-01), Winslow et al.
patent: 6378387 (2002-04-01), Froom
patent: 6560555 (2003-05-01), Mallory
patent: 6594591 (2003-07-01), Clark et al.
patent: 6697466 (2004-02-01), Howard et al.
patent: 6727691 (2004-04-01), Goldfine et al.
patent: 6784662 (2004-08-01), Schlicker et al.
patent: 6836560 (2004-12-01), Emery
patent: 6975108 (2005-12-01), Bilik et al.
patent: 2005/0127908 (2005-06-01), Schlicker et al.
Papadimitriou, Steve et al, “The Inspection of Used Coiled Tubing”, Second International Conference and Exhibition on Coiled Tubing Technology, Adams Mark Hotel, Houston, Texas, Mar. 28-31, 1994.

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