Extraction of imperfection features through spectral analysis

Details Extraction of imperfection features through spectral analysis Extraction of imperfection features through spectral analysis

2007-06-12

2007-06-12

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C702S034000, C702S035000, C702S183000, C324S228000

Reexamination Certificate

active

11079745

ABSTRACT:
Autonomous non-destructive inspection equipment provides automatic and/or continuous inspection and evaluation of a material under inspection. The inspection equipment preferably comprises at least one detection sensor and at least one detection sensor interface for a computer. The autonomous non-destructive inspection system may also be retrofitted into conventional inspection systems by extracting pertinent features through spectral frequency analysis and sensor compensation and utilizing those features in the autonomous non-destructive inspection system.

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