Extracting resistances for a substrate network

Details Extracting resistances for a substrate network Extracting resistances for a substrate network

2005-05-17

2005-05-17

Tsai, Carol (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C716S030000, C716S030000, C455S003020

Reexamination Certificate

active

06895344

ABSTRACT:
Determining a substrate resistance network includes receiving a description of a substrate network including nodes. Elements of the substrate network are identified and associated with one or more nodes, where the elements include nwell structures. For each nwell structure, a ring geometry and area geometries result from dividing the nwell structure, where the area geometries represent an inward portion of the nwell structure and where each area geometry is associated with an area resistive element and an area coordinate. The ring geometry represents a perimeter portion of the nwell structure. Side geometries are formed from the ring geometry, each side geometry associated with a side resistive element. An nwell group is formed including the area geometries associated with the nwell structure in accordance with the area coordinates. An nwell resistance network is determined for each nwell group using the area resistive elements and the side resistive elements.

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