Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2007-10-23
2008-11-18
Mariam, Daniel G (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S141000
Reexamination Certificate
active
07454066
ABSTRACT:
An extracting method of a pattern contour, includes acquiring an image of a pattern to be inspected, calculating a schematic edge position of the pattern from the image, preparing an approximate polygon by approximating a polygon consisting of edges having predetermined direction components to a contour shape of the pattern on the basis of the calculated edge position, dividing the approximate polygon into star-shaped polygons, calculating the position of a kernel of the star-shaped polygon, and searching an edge of the-pattern in a direction connecting the kernel to an arbitrary point positioned on the edge of the approximate polygon.
REFERENCES:
patent: 4910786 (1990-03-01), Eichel
patent: 6181818 (2001-01-01), Sato et al.
patent: 6317859 (2001-11-01), Papadopoulou
patent: 6868175 (2005-03-01), Yamamoto et al.
patent: 2001/0055415 (2001-12-01), Nozaki
patent: 7-27548 (1995-01-01), None
patent: 2001-91231 (2001-04-01), None
patent: 2001-148016 (2001-05-01), None
patent: 2003-16463 (2003-01-01), None
Preparata et al., “Computational Geometry An Introduction,” Springer-Verlag (1985), pp. 179-218.
Stauffer, “Introduction to Percolation Theory,” Taylor & Francis (1985).
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
Mariam Daniel G
LandOfFree
Extracting method of pattern contour, image processing... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Extracting method of pattern contour, image processing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Extracting method of pattern contour, image processing... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4037643