Extensometer structure

Details Extensometer structure Extensometer structure

1996-10-16

1998-01-27

Chilcot, Richard

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

By loading of specimen

73826, 73760, 33787, G01N 308

Patent

active

057124302

ABSTRACT:
An extensometer structure for an extensometer includes a first extension arm, a second extension arm and a rigid support. A first hinge assembly joins the first extension arm to the rigid support. The first hinge assembly has a first pivot axis that allows the first extension arm to pivot relative to the rigid support about the pivot axis. A second hinge assembly joins the second extension arm to the rigid support. The second hinge assembly has a second pivot axis allowing the second extension arm to pivot relative to the rigid support about the second pivot axis.

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patent: 5463902 (1995-11-01), Shrive et al.
patent: 5537754 (1996-07-01), Bachmann et al.
patent: 5600895 (1997-02-01), Meyer et al.

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