Extended-range moire contouring

Details Extended-range moire contouring Extended-range moire contouring

1986-10-15

1988-12-27

Lall, Parshotam S.

Boots, shoes, and leggings

364525, 364563, 356357, 250550, G01B 1102

Patent

active

047945508

ABSTRACT:
The measurement range of Moire contouring techniques is extended beyond the Nyquist frequency limit by constraining the reconstruction of a surface contour according to a priori knowledge about the surface. In one example the a priori knowledge is that the surface is smooth, being described by a function having continuous derivatives, and the location of a region where the surface changes by less than C/2 per sample. In another example, the a priori knowledge is the location and height of a step discontinuity to within C/2, where C is the contour interval.

REFERENCES:
patent: 3943278 (1976-03-01), Ramsey, Jr.
patent: 4111557 (1978-09-01), Rottenkolber et al.
patent: 4155098 (1979-05-01), Roach et al.
patent: 4169980 (1979-10-01), Zanoni
patent: 4212073 (1980-07-01), Balasubramanian
patent: 4498770 (1985-02-01), Corwin et al.
patent: 4564295 (1986-01-01), Halioua
patent: 4697927 (1987-10-01), Ono
"Moire Topography, Sampling Theory, and Charge-Coupled Devices", by B. W. Bell and C. L. Koliopoulos, Optics letters, vol. 9, p. 171, May 1974.

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