Oscillators – Molecular or particle resonant type
Patent
1994-05-13
1995-05-30
Grimm, Siegfried H.
Oscillators
Molecular or particle resonant type
331 3, 324304, H03L 726
Patent
active
054205492
ABSTRACT:
A linear ion trap for frequency standard applications is provided with a plurality of trapping rods equally spaced and applied quadrupole rf voltages for radial confinement of atomic ions and biased level pins at each end for axial confinement of the ions. The trapping rods are divided into two linear ion trap regions by a gap in each rod in a common radial plane to provide dc discontinuity, thus dc isolating one region from the other. A first region for ion-loading and preparation/fluorescence is biased with a dc voltage to transport ions into a second region for resonance/frequency comparison with a local oscillator derived frequency while the second region is held at zero voltage. The dc bias voltage of the regions is reversed for transporting the ions back into the first region for fluorescence/measurement. The dual mode cycle is repeated continuously for comparison and feedback control of the local oscillator derived frequency. Only the second region requires magnetic shielding for the resonance function which is sensitive to any ambient magnetic fields.
REFERENCES:
patent: 5248883 (1993-09-01), Brewer et al.
Leonard S. Cutler et al., "A Trapped Mercury 199 Ion Frequency Standard," Proc. of 13th Annual Precise Time and Time Interval (PTTI) Applications & Planning Meeting, NASA Conf. Pub. 2220, pp. 563-577, Dec. 1-3, 1981.
John D. Prestage et al., "Ultra-Stable Hg.sup.+ Trapped Ion Frequency Standard," Journal of Modern Optics, vol. 39, pp. 221-232, 1992.
R. L. Tjoelker et al., "Long Term Stability of Hg.sup.+ Trapped Ion Frequency Standards," 1993 IEEE International Frequency Control Symposium, pp. 132-138.
L. S. Cutler et al., "Thermalization of .sup.199 Hg Ion Macromotion by a Light Background Gas in an RF Quadrupole Trap," Appl. Phys. B36, pp. 137-142, 1985.
J. D. Prestage et al., "New Ion Trap for Frequency Standard Applications," J. Appl. Phys. 66, pp. 1013-1017, Aug. 1, 1989.
Grimm Siegfried H.
Jones Thomas H.
Kusmiss John H.
Miller Guy M.
The United States of America as represented by the Administrator
LandOfFree
Extended linear ion trap frequency standard apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Extended linear ion trap frequency standard apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Extended linear ion trap frequency standard apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-365197