Extended ion sources and method for using them in an insulation

Details Extended ion sources and method for using them in an insulation Extended ion sources and method for using them in an insulation

1988-11-04

1990-08-21

Laroche, Eugene R.

Electric lamp and discharge devices: systems

Discharge device load with fluent material supply to the...

Electron or ion source

250423R, 324539, 324541, 324543, 324544, H01J 2702

Patent

active

049509578

ABSTRACT:
A method of detecting insulation defects in a wire using an extended ion source wherein ions are generated along the entire length of the extended ion source and flow toward an insulated cable located in close proximity thereto. If there are defects in the cable insulation, a real current will flow through the insulation defects and into the cable conductor. The presence of this real current can be measured by connecting one end of the cable conductor to an ammeter and changes in this current indicate the existence of a defect in the wire insulation. In another embodiment of the extended ion source, the ions are generated only in a small portion of the extended source at any one time. By exciting the source with the proper sequence of signals, the ion generation scans or propagates along the entire length of the extended ion source.

REFERENCES:
patent: 2044424 (1936-06-01), Edwards et al.
patent: 3096478 (1963-07-01), Brown
patent: 3131347 (1964-04-01), Brooks et al.
patent: 3263165 (1966-07-01), Eigen
patent: 3421076 (1969-01-01), Eigen
patent: 3440528 (1969-04-01), Anderson
patent: 3515986 (1970-06-01), Peschel
patent: 3612994 (1971-10-01), Hooper
patent: 3639831 (1972-02-01), Cushman
patent: 3968426 (1976-07-01), Ward, Jr. et al.
patent: 3990003 (1976-11-01), Agee, Jr. et al.
patent: 4296372 (1981-10-01), Feuerbaum
patent: 4422034 (1983-12-01), Matsuno et al.
patent: 4862032 (1989-08-01), Kaufman et al.

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