Optics: measuring and testing – Photometers – Photoelectric
Patent
1974-09-06
1976-03-16
Heyman, John S.
Optics: measuring and testing
Photometers
Photoelectric
250214R, 307311, G01J 144
Patent
active
039443701
ABSTRACT:
A voltage proportional to the APEX indication quantity for exposure time is coupled to one terminal of a meter through a buffer stage transistor. Circuit means produce a reference potential which is applied to the other terminal of the meter. The buffer stage transistor is biased by circuitry including a feedback stage transistor with the biasing being such that substantially constant collector current operation is ensured.
REFERENCES:
patent: 3518438 (1970-06-01), Hart et al.
patent: 3723014 (1973-03-01), Nanba
patent: 3753388 (1973-08-01), Toyoda
patent: 3829866 (1974-08-01), Nobushawa
Asahi Kogaku Kogyo Kabushiki Kaisha
Heyman John S.
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