Exposure method for forming pattern for IC chips on reticle...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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C430S311000, C430S312000

Reexamination Certificate

active

07029799

ABSTRACT:
There is provided a method which forms master masks used when a pattern of size larger than a region which can be exposed at one time is exposed on a to-be-exposed object. The pattern of the size larger than the region which can be exposed at one time is divided into a region of low repetitiveness and a region of high repetitiveness. A pattern of the region of low repetitiveness is drawn on at least one first master mask. Further, a pattern of the region of high repetitiveness is drawn on at least one second master mask.

REFERENCES:
patent: 5567575 (1996-10-01), Hirama
patent: 5705299 (1998-01-01), Tew et al.
patent: 6136517 (2000-10-01), Fletcher
patent: 6165692 (2000-12-01), Kanai et al.
patent: 6340542 (2002-01-01), Inoue et al.
patent: 1275797 (2000-12-01), None
patent: 1 043 625 (2000-10-01), None
patent: 55-108738 (1980-08-01), None
patent: 58-173832 (1983-10-01), None
S. Kyoh et al; “Management Of Pattern Generation System Based on I-Line Stepper” International Society for Optical Engineering—20thAnnual BACUS Symposium On Photomask Technology, vol. 4186, 9 pages, (Sep. 20, 2000).

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