Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2011-06-21
2011-06-21
Huff, Mark F (Department: 1721)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
Reexamination Certificate
active
07964326
ABSTRACT:
A divided exposure method for a photolithography process is disclosed, which uses a mask. The mask for an exposer having a left and right light intensity deviation includes a substrate; a first pattern in a middle of the substrate; and second and third patterns on left and right sides of the first pattern, respectively, wherein the first and second patterns compensate for the left and right light intensity deviation of the exposer.
REFERENCES:
patent: 4408875 (1983-10-01), Majima
patent: 5922495 (1999-07-01), Kim
patent: 7211372 (2007-05-01), Park et al
patent: 2001/0017693 (2001-08-01), Zheng et al.
patent: 2001/0018153 (2001-08-01), Irie
patent: 2001/0053489 (2001-12-01), Dirksen et al.
patent: 2005/0024622 (2005-02-01), Kim
patent: 2006/0088790 (2006-04-01), Moon et al.
patent: 10-0392054 (2003-03-01), None
Lee Su Woong
Paik Sang Yoon
Huff Mark F
LG Display Co. Ltd.
McKenna Long & Aldridge LLP
Ruggles John
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