Exposure mask for divided exposure

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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Reexamination Certificate

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07964326

ABSTRACT:
A divided exposure method for a photolithography process is disclosed, which uses a mask. The mask for an exposer having a left and right light intensity deviation includes a substrate; a first pattern in a middle of the substrate; and second and third patterns on left and right sides of the first pattern, respectively, wherein the first and second patterns compensate for the left and right light intensity deviation of the exposer.

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patent: 2001/0053489 (2001-12-01), Dirksen et al.
patent: 2005/0024622 (2005-02-01), Kim
patent: 2006/0088790 (2006-04-01), Moon et al.
patent: 10-0392054 (2003-03-01), None

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