Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Patent
1997-03-07
2000-12-12
Chapman, Mark
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
216 12, G03F 900
Patent
active
061596426
ABSTRACT:
An exposure mask includes a transparent substrate having a light shielding pattern and an aperture pattern thereon for transmitting an exposure light and arranged in that any two adjacent apertures of the same pattern size in the aperture pattern are different from each other in the etched depth, wherein a difference between the aperture pattern size and its adjacent light shielding pattern size, and the trench depth in the aperture pattern are determined by a sum of the aperture pattern size and its adjacent light shielding pattern size.
REFERENCES:
patent: 5348826 (1994-09-01), Dao et al.
patent: 5465859 (1995-11-01), Chapple-Sokol et al.
patent: 5549995 (1996-08-01), Tanaka et al.
Inoue Soichi
Ito Shin'ichi
Kanai Hideki
Kawano Kenji
Tanaka Satoshi
Chapman Mark
Kabushiki Kaisha Toshiba
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