Exposure mask and a method of making a semiconductor device...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S311000

Reexamination Certificate

active

07820345

ABSTRACT:
Disclosed herein are an exposure mask and a method of making a semiconductor device using the mask. The exposure mask includes a transparent substrate; and a light blocking pattern having first and second patterns, and an assist feature disposed between the first and second patterns and including a dot pattern arranged into two rows deviated from each other. The exposure make can improve the depth of focus margin to allow for the high integration of a semiconductor device.

REFERENCES:
patent: 2002/0045106 (2002-04-01), Baselmans et al.
patent: 2004/0131950 (2004-07-01), Butt et al.
patent: 2006/0199084 (2006-09-01), Word
patent: 2006/0269848 (2006-11-01), Setta
patent: 2009/0142674 (2009-06-01), Moon
patent: 10-2000-0075841 (2000-12-01), None
patent: 10-2007-0112032 (2007-11-01), None
Notice of Rejection for Korean Patent Application No. 10-2008-0022618, dated Jun. 23, 2009.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Exposure mask and a method of making a semiconductor device... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Exposure mask and a method of making a semiconductor device..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Exposure mask and a method of making a semiconductor device... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4166909

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.