Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2008-06-27
2010-10-26
Huff, Mark F (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
C430S311000
Reexamination Certificate
active
07820345
ABSTRACT:
Disclosed herein are an exposure mask and a method of making a semiconductor device using the mask. The exposure mask includes a transparent substrate; and a light blocking pattern having first and second patterns, and an assist feature disposed between the first and second patterns and including a dot pattern arranged into two rows deviated from each other. The exposure make can improve the depth of focus margin to allow for the high integration of a semiconductor device.
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patent: 2004/0131950 (2004-07-01), Butt et al.
patent: 2006/0199084 (2006-09-01), Word
patent: 2006/0269848 (2006-11-01), Setta
patent: 2009/0142674 (2009-06-01), Moon
patent: 10-2000-0075841 (2000-12-01), None
patent: 10-2007-0112032 (2007-11-01), None
Notice of Rejection for Korean Patent Application No. 10-2008-0022618, dated Jun. 23, 2009.
Fraser Stewart A
Huff Mark F
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
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