Exposure apparatus, measurement method, stabilization...

Photocopying – Projection printing and copying cameras – Step and repeat

Reexamination Certificate

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C355S072000

Reexamination Certificate

active

07961295

ABSTRACT:
The present invention provides an exposure apparatus including a projection optical system configured to project a reticle pattern onto a wafer, a selector configured to select a dummy wafer to be placed near an image plane of the projection optical system, from a plurality of dummy wafers having the same shape as that of the wafer and different reflectance with each other, a transfer unit configured to place the dummy wafer selected by the selector near the image plane of the projection optical system, and a controller configured to perform control such that dummy exposure is performed by irradiating the dummy wafer, which is placed near the image plane of the projection optical system by the transfer unit, with light via the projection optical system.

REFERENCES:
patent: 4506977 (1985-03-01), Sato
patent: 6163365 (2000-12-01), Takahashi
patent: 7586605 (2009-09-01), Fukuhara
patent: 2004/0183013 (2004-09-01), Nakasuji et al.
patent: 2007/0274711 (2007-11-01), Kaneyama et al.
patent: 2009/0153813 (2009-06-01), Shiraishi
patent: 63-016725 (1988-04-01), None
patent: 10-116766 (1998-05-01), None

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