Exposure apparatus comprising cleaning apparatus for...

Photocopying – Projection printing and copying cameras – With temperature or foreign particle control

Reexamination Certificate

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C355S071000

Reexamination Certificate

active

07379151

ABSTRACT:
An exposure apparatus for exposing a pattern of a mask onto a plate to be exposed, the exposure apparatus includes a cleaning apparatus for cleaning the mask. The cleaning apparatus includes an irradiating part for irradiating a laser beam to the mask, and a polarization controller for controlling a polarization characteristic of the laser beam according to a longitudinal direction of the pattern.

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patent: 2004/0119954 (2004-06-01), Kawashima et al.
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patent: 2-86128 (1990-03-01), None
D.J. Rader, D.E. Dedrick, E.W. Beyer, A.H. Leung, and L.E. Klebanoff, “Verification studies of thermophoretic protection for EUV masks”, Emerging Lithographic Technologies VI, Proceedings of SPIE, vol. 4688, 2002, pp. 182-193.
Roel Moors and Gert-Jan Heerens, “Electrostatic mask protection for extreme ultraviolet lithography”. Journal of Vacuum Science & Technology B,. vol. 20, No. 1. Jan./Feb. 2002, pp. 316-320.
E.E. Scime, E.H. Anderson, D.J. McComas, and M.L. Schattenburg, “Extreme-ultraviolet polarization and filtering with gold transmission gratings”, Applied Optics, vol. 34, No. 4, Feb. 1, 1995, pp. 648-654.
Isamu Kato, Takahiko Mitsuda, and Sin-ichi Ishizaka, “Cleaning of Si wafer surface for excimer laser”, pp. 79-83 and translation pp. 1-4.
G. Vereecke, E. Rohr, and M. M. Heyns, “Laser-assisted removal of particles on silicon wafer”, Journal of Applied Physics, vol. 85, No. 7, Apr. 1, 1999, pp. 3837-3843.

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