Exposure apparatus and reflection type mask to be used in the sa

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

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430321, 430322, 378 34, 378 35, G03F 900

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055499945

ABSTRACT:
A reflection type mask includes a reflective portion having a multilayered film, a non-reflective portion having an absorbing material and being formed on the multilayered film, and a non-reflective portion being defined by destroying the multilayered film.

REFERENCES:
patent: 5012500 (1991-04-01), Watanabe et al.
patent: 5052033 (1991-09-01), Ikeda et al.
patent: 5272744 (1993-12-01), Itou et al.
patent: 5335259 (1994-08-01), Hayashida et al.
patent: 5399448 (1995-03-01), Nagata et al.
A. M. Hawryluk, et al., "Reflection Mask Defect Repair," Applied Optics, vol. 32, No. 34, Dec. 1993, pp. 7012-7015.
Patent Abstracts Of Japan, Kokai No. 4-346-214. vol. 17, No. 203, Apr. 1993.
Patent Abstracts Of Japan, Kokai No. 5-088-355, vol. 17, No. 428, Aug. 1993 .

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