Exposure apparatus and exposure method

Photocopying – Projection printing and copying cameras – Step and repeat

Reexamination Certificate

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Details

C356S401000

Reexamination Certificate

active

06970231

ABSTRACT:
An exposure method of projecting a pattern of an original onto a substrate. The method includes steps of measuring a position of an alignment mark formed on the substrate, projecting the pattern onto the substrate based on a measurement result in the measurement step, and projecting, onto the substrate based on the measurement result, a mark, which has a known relative position from a reference pattern arranged on an original stage and to align the original stage and a substrate stage, and is arranged on the original stage and to form an alignment mark on the substrate.

REFERENCES:
patent: 5249016 (1993-09-01), Tanaka
patent: 5774575 (1998-06-01), Tanaka et al.
patent: 5815594 (1998-09-01), Tanaka
patent: 6023320 (2000-02-01), Kawashima
patent: 2002/0154283 (2002-10-01), Tanaka et al.
patent: 2003/0053058 (2003-03-01), Tanaka
patent: 2003/0053059 (2003-03-01), Mishima et al.
patent: 2003/0174330 (2003-09-01), Tanaka et al.
patent: 2003/0235330 (2003-12-01), Tanaka
patent: 7-273018 (1995-10-01), None
patent: 9-275058 (1997-10-01), None
patent: 10-242043 (1998-09-01), None

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