Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-07-01
2008-07-01
Nghiem, Michael P. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07395164
ABSTRACT:
A computer program for performing a method of providing a parameter estimate from noisy data with aperiodic data arrival. The parameter of the measurement is estimated as a numerator divided by the denominator. The method involves setting a fixed time interval and then waiting for the time interval to expire or for a measurement to occur. If a measurement occurs before the time interval expires the numerator is estimated as a previous numerator plus the new measurement, and the denominator is estimated as a previous denominator plus one. Regardless of whether the measurement occurs or the time interval expires the numerator is estimated as a previous numerator times a step size and the denominator is estimated as a previous denominator times a step size. The method can be applied to numerous applications including assessing data temperature and predicting I/O response times.
REFERENCES:
patent: 3952304 (1976-04-01), Broniwitz et al.
patent: 6441743 (2002-08-01), Berger
patent: 6442166 (2002-08-01), McDonald et al.
patent: 6904390 (2005-06-01), Nikitin et al.
patent: 7006838 (2006-02-01), Diener et al.
patent: 2003/0076065 (2003-04-01), Shafer et al.
patent: 2006/0198352 (2006-09-01), Bruck et al.
Tian et al., “Smooth Exponential Stabilization of Nonholonomic Systems via time-varying feedback”, Dec. 2000, IEEE, pp. 1912-1917.
Xu et al., “Blind Channel Estimation in Aperiodic Time-Hopping Ultra-Wideband Communications”, Jun. 2006, IEEE, pp. 2333-2346.
Khuu Cindy D
Nghiem Michael P.
Park A J
Teradata , US Inc.
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