Experiment management system and method thereof in...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

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C700S095000, C700S097000, C438S015000, C438S016000

Reexamination Certificate

active

07133735

ABSTRACT:
A system and method thereof for experiment management. A storage device stores an experiment plan record, a merge constraint and an integration rule. A processing unit configured to acquire a first experiment plan from the experiment plan record, and a second experiment plan. The processing unit generates an integrated experiment plan by merging the first experiment plan and the second experiment plan according to the merge constraint and the integration rule, and stores the integrated experiment plan to the storage device.

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patent: 6604012 (2003-08-01), Cho et al.
patent: 6984198 (2006-01-01), Krishnamurthy et al.
patent: 2005/0197986 (2005-09-01), Schuppert et al.
“Design of Automated Experiment Management System with Applications to R&D and Large Volume Semiconductor Manufacturing”-Jun et al, Applied Materials Inc., IEEE 2005.
“A Macromodeling Based Approach For Efficient IC Yield Optimization”-Feldmann et al, Carnegie Mellon University, IEEE CH 3006-4/91/0000—2260.
“Model-Based Product Quality Control”-Ramakrishnan et al, Intel Corporation, IEEE 1995.

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