Optics: measuring and testing – For optical fiber or waveguide inspection
Patent
1991-05-16
1992-07-14
McGraw, Vincent P.
Optics: measuring and testing
For optical fiber or waveguide inspection
340709, G01N 2188, G01R 1330
Patent
active
051297221
ABSTRACT:
A system for expanding a waveform in a measurement test instrument has a display area containing a waveform representative of data acquired by a measurement test instrument and an active movable cursor intersecting the waveform. The system has first and second viewports with the first viewport displaying the waveform in the display area and the second viewport displaying a portion of the waveform from the first view port in an expanded form when the second viewport is in the display area. The second viewport has a center point and dimensions defined in the first viewport with the center point being defined by the intersection of the active movable cursor with the waveform and the dimensions being defined with respect with the center point. The second viewport is movable within the first viewport as a function of movement of the cursor. Means are provided for varying the dimensions of the second viewport about the cursor/waveform intersection when the first viewport is in the display area and for further expanding the waveform in a continuous manner about the cursor/waveform intersection when the second viewport is in the display area. Means are provided for replacing the first viewport with the second viewport in the display area.
REFERENCES:
patent: 4898463 (1990-02-01), Sakamoto et al.
Bateman Glenn
Bremer Ronald J.
Harcourt Matthew
Lane Richard I.
Mader Josef L.
Bucher William K.
McGraw Vincent P.
Tektronix Inc.
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